Microfabricated dynamic scanning force microscope using a three dimensional piezoelectric T-shape actuator

被引:20
作者
Chu, J
Maeda, R
Itoh, T
Kataoka, K
Suga, T
机构
[1] Minist Int Trade & Ind, Agcy Ind Sci & Technol, Mech Engn Lab, Tsukuba, Ibaraki 3050044, Japan
[2] Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1530041, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1999年 / 38卷 / 12B期
关键词
MEMS; micro-DSFM; micro force sensor; actuator; piezoelectric material; microfabrication;
D O I
10.1143/JJAP.38.7180
中图分类号
O59 [应用物理学];
学科分类号
摘要
A microfabricated dynamic scanning force microscope (DSFM) system integrated with a self-exciting piezoelectric force sensor and position actuators for three dimensions is presented. It is a cantilever-bridge structure composed of two PZT (lead titanate zirconate) layers. The electrodes of the levers are each divided into two sections. Electric fields applied to the separated sections can induce lever deflection and actuate the tip in the x, y, and z directions. The cantilever can vibrate in the z direction and sense the deflection by its self to detect the surface topography in the cyclic contact made. The microscopy sensitivity in the vertical direction is measured as 0.32 nA/nm, with actuation rates of 83 nm/+/-V and 73 nm/+/-V in X and Y directions, respectively.
引用
收藏
页码:7180 / 7184
页数:5
相关论文
共 20 条
[1]   A PLANAR PROCESS FOR MICROFABRICATION OF A SCANNING TUNNELING MICROSCOPE [J].
AKAMINE, S ;
ALBRECHT, TR ;
ZDEBLICK, MJ ;
QUATE, CF .
SENSORS AND ACTUATORS A-PHYSICAL, 1990, 23 (1-3) :964-970
[2]   MICROFABRICATED SCANNING TUNNELING MICROSCOPE [J].
AKAMINE, S ;
ALBRECHT, TR ;
ZDEBLICK, MJ ;
QUATE, CF .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (11) :490-492
[3]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[4]   Frequency modulation detection high vacuum scanning force microscope with a self-oscillating piezoelectric cantilever [J].
Chu, JR ;
Itoh, T ;
Lee, CK ;
Suga, T ;
Watanabe, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (05) :1647-1651
[5]   Novel high vacuum scanning force microscope using a piezoelectric cantilever and the phase detection method [J].
Chu, JR ;
Itoh, T ;
Lee, CK ;
Suga, T ;
Watanabe, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04) :1551-1555
[6]   Novel approach to atomic force lithography [J].
Hu, S ;
Altmeyer, S ;
Hamidi, A ;
Spangenberg, B ;
Kurz, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04) :1983-1986
[7]  
Itoh T., 1993, Nanotechnology, V4, P218, DOI 10.1088/0957-4484/4/4/007
[8]  
ITOH T, 1909, IEICE T ELECT EC, V78, P146
[9]  
ITOH T, 1997, P 10 ANN INT WORKSH, P323
[10]  
LEE C, P 2 C NAN MICR MECH, P201