The most powerful tool for the structural analysis of tungsten suboxide nanowires: Raman spectroscopy

被引：32

作者：

Lu, Dong Yu ^{[1
]}

Chen, Jian ^{[1
,2
]}

Deng, Shao Zhi ^{[1
]}

Xu, Ning Sheng ^{[1
]}

Zhang, Wei Hong ^{[2
]}

机构：

[1] Zhongshan Univ, Guangdong Province Key Lab Display Mat & Technol, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Peoples R China

[2] Zhongshan Univ, Instrumentat Anal & Res Ctr, Guangzhou 510275, Peoples R China

来源：

JOURNAL OF MATERIALS RESEARCH | 2008年 / 23卷 / 02期

关键词：

D O I：

10.1557/JMR.2008.0056

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Crystalline tungsten suboxide nanowires were grown on silicon substrates by thermal evaporation of tungsten powder in a flow of argon gas without any catalyst. With different growth temperatures, two kinds of tungsten suboxide nanowires (W,,049 and W20O58) were obtained. The structures, morphologies, and compositions of these two nanowires were characterized by scanning electron microscopy (SEM), electron probe microanalyzer (EPMA), x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), x-ray photoelectron spectroscopy (XPS), and Raman techniques. The results show that XRD and TEM are not good characterization techniques for identifying W18O49 and W20O58 nanowires; however, Raman spectroscopy (RS) is a powerful tool to distinguish the difference between them. This is due to the notable molecular bond contributing to the vibrational frequency.

引用

页码：402 / 408

页数：7

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