Nanoparticle size distribution estimation by a full-pattern powder diffraction analysis

被引:25
作者
Cervellino, A [1 ]
Giannini, C
Guagliardi, A
Ladisa, M
机构
[1] Paul Scherrer Inst, Neutron Scattering Lab, CH-5232 Villigen, Switzerland
[2] Swiss Fed Inst Technol, CH-5232 Villigen, Switzerland
[3] CNR, IC, I-70126 Bari, Italy
关键词
D O I
10.1103/PhysRevB.72.035412
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The increasing scientific and technological interest in nanoparticles has raised the need for fast, efficient, and precise characterization techniques. Powder diffraction is a very efficient experimental method, as it is straightforward and nondestructive. However, its use for extracting information regarding very small particles brings some common crystallographic approximations to and beyond their limits of validity. Powder pattern diffraction calculation methods are critically discussed, with special focus on spherical particles with log-normal distributions, with the target of determining size distribution parameters. A 20-nm CeO2 sample is analyzed as an example.
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页数:9
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