Excimer-laser-induced degradation of fused silica and calcium fluoride for 193-nm lithographic applications

被引:41
作者
Liberman, V
Rothschild, M
Sedlacek, JHC
Uttaro, RS
Grenville, A
Bates, AK
Van Peski, C
机构
[1] MIT, Lincoln Lab, Lexington, MA 02420 USA
[2] Intel Corp, Hillsboro, OR 97124 USA
[3] SEMATECH, IBM, Austin, TX 78741 USA
关键词
D O I
10.1364/OL.24.000058
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report the initial results of a large-scale evaluation of production-grade fused silica and calcium fluoride to be used in 193-nm lithographic applications. The samples have been provided by many different suppliers of materials. A marathon irradiation chamber permits simultaneous exposure of as many as 36 samples at 800 Hz, at fluences from 0.2 to greater than or equal to 4 (mJ/cm(2))/pulse and pulse counts in excess of 10(9). The initial absorption and the laser-induced absorption are found to vary over a wide range. The compaction of each fused-silica sample follows a power law, but its parameters can differ widely from sample to sample. (C) 1999 Optical Society of America.
引用
收藏
页码:58 / 60
页数:3
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