Step and flash imprint lithography: Template surface treatment and defect analysis

被引:349
作者
Bailey, T [1 ]
Choi, BJ [1 ]
Colburn, M [1 ]
Meissl, M [1 ]
Shaya, S [1 ]
Ekerdt, JG [1 ]
Sreenivasan, SV [1 ]
Willson, CG [1 ]
机构
[1] Univ Texas, Texas Mat Inst, Austin, TX 78727 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 06期
关键词
D O I
10.1116/1.1324618
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have finished the construction of an automated tool for step and flash imprint lithography. The tool was constructed to allow defect studies by making multiple imprints on a 200 mm wafer. The imprint templates for this study were treated with a low surface energy, self-assembled monolayer to ensure selective release at the template-etch barrier interface. This surface treatment is very durable and survives repeated imprints and multiple aggressive physical and chemical cleanings. The imprint and release forces were measured for a number of successive imprints, and did not change significantly. The process appears to be "self-cleaning." Contamination on the template is entrained in the polymerizing liquid, and the number of defects is reduced with repeated imprints. (C) 2000 American Vacuum Society. [S0734-211X(00)16106-2].
引用
收藏
页码:3572 / 3577
页数:6
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