Patterning curved surfaces: Template generation by ion beam proximity lithography and relief transfer by step and flash imprint lithography

被引:129
作者
Ruchhoeft, P [1 ]
Colburn, M
Choi, B
Nounu, H
Johnson, S
Bailey, T
Damle, S
Stewart, M
Ekerdt, J
Sreenivasan, SV
Wolfe, JC
Willson, CG
机构
[1] Univ Houston, Dept Elect & Comp Engn, Houston, TX 77204 USA
[2] Univ Texas, Texas Mat Inst, Austin, TX 78712 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1999年 / 17卷 / 06期
关键词
D O I
10.1116/1.590935
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Submicron patterning of 1 in. diameter curved Surfaces with a 46 mm radius of curvature has been demonstrated with step and flash imprint lithography (SLIL) using templates patterned by ion beam proximity printing (IBP). Concave and convex spherical quartz templates were coated with 700-nm-thick poly(methylmethacrylate) (PMMA) and patterned by step-and-repeat IBP. The developed resist features were etched into the quartz template and the remaining PMMA stripped. During SFIL, a low viscosity, photopolymerizable formulation containing organosilicon precursors was introduced into the gap between the etched template and a substrate coated with an organic transfer layer and exposed to ultraviolet illumination. The smallest features on the templates were faithfully replicated in the silylated layer. (C) 1999 American Vacuum Society. [S0734-211X(99)11006-0].
引用
收藏
页码:2965 / 2969
页数:5
相关论文
共 13 条
  • [1] Nanoimprint lithography
    Chou, SY
    Krauss, PR
    Renstrom, PJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4129 - 4133
  • [2] COLBURN M, 1999, SPIE 24 INT S MICR E
  • [3] Mold-assisted nanolithography: A process for reliable pattern replication
    Haisma, J
    Verheijen, M
    vandenHeuvel, K
    vandenBerg, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4124 - 4128
  • [4] HAMILTON W, 1999, INT REPORT DARMA MLP
  • [5] JOHNSON S, 1999, THESIS U TEXAS AUSTI
  • [6] Reactive ion etching of silicon stencil masks in the presence of an axial magnetic field
    Pendharkar, SV
    Wolfe, JC
    Rampersad, HR
    Chau, YL
    Licon, DL
    Morgan, MD
    Home, WE
    Tiberio, RC
    Randall, JN
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06): : 2588 - 2592
  • [7] Problems of the nanoimprinting technique for nanometer scale pattern definition
    Scheer, HC
    Schulz, H
    Hoffmann, T
    Torres, CMS
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06): : 3917 - 3921
  • [8] Smith S. T., 1992, FDN ULTRAPRECISION M
  • [9] HIGH-PRECISION MOTION AND ALIGNMENT IN AN ION-BEAM PROXIMITY PRINTING SYSTEM
    STUMBO, DP
    DAMM, GA
    SEN, S
    ENGLER, DW
    FONG, FO
    WOLFE, JC
    ORO, JA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3597 - 3600
  • [10] A proximity ion beam lithography process for high density nanostructures
    Wolfe, JC
    Pendharkar, SV
    Ruchhoeft, P
    Sen, S
    Morgan, MD
    Horne, WE
    Tiberio, RC
    Randall, JN
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 3896 - 3899