Band-gap dependence of field emission from one-dimensional nanostructures grown on n-type and p-type silicon substrates -: art. no. 125322

被引:43
作者
Chang, CS [1 ]
Chattopadhyay, S
Chen, LC
Chen, KH
Chen, CW
Chen, YF
Collazo, R
Sitar, Z
机构
[1] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan
[2] Acad Sinica, Inst Atom & Mol Sci, Taipei 106, Taiwan
[3] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 106, Taiwan
[4] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan
[5] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27613 USA
来源
PHYSICAL REVIEW B | 2003年 / 68卷 / 12期
关键词
D O I
10.1103/PhysRevB.68.125322
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Field emission of electrons from narrow-band-gap and wide-band-gap one-dimensional nanostructures were studied. N-type silicon substrates enhanced the emission from the low-band-gap silicon nanowires and carbon nanotubes, whereas p-type substrates were a better choice for field emission from wide-band-gap silicon carbon nitride nanocrystalline thin films and nanorods. The role of the substrate-nanostructure interface was modeled based on different junction mechanisms to explain, qualitatively, the fundamentally different emission behavior of these nanostructures when n- and p-type silicon substrates were used. The results could be explained on the basis of simple carrier transport across the silicon-silicon nanowire interface and subsequent tunneling of electrons for the silicon nanowires. Schottky barrier theory can explain the better field emission of electrons from the n-type silicon supported carbon nanotubes. The decreased barrier height at the interface of the silicon-silicon carbon nitride heterojunction, when p-type silicon substrate was used, could explain the superior field emission in comparison to when n-type silicon substrates were used.
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页数:5
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