Intrinsic and effective secondary electron emission coefficients in AC plasma display panel

被引:34
作者
Yoon, SJ [1 ]
Lee, I
Lee, JW
Oh, B
机构
[1] LG Elect Inst Technol, Seoul 137724, South Korea
[2] Hallym Univ, Dept Phys, Chunchon 200702, Kang Won Do, South Korea
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2001年 / 40卷 / 2A期
关键词
secondary electron emission coefficient; AC-PDP; MgO;
D O I
10.1143/JJAP.40.809
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ion-induced secondary electron emission from the MgO protecting layer of an AC plasma display panel (AC-PDP) and the successive back-scattering of secondary electrons toward the cathode due to high gas pressure have been studied theoretically. A correlation between the intrinsic secondary electron emission coefficient (gamma (i)) and the TvIEO surface properties such as band gap energy and defect states in the band gap was found. The behavior of the effective secondary electron emission coefficient (gamma (eff)) of various ion species as a function of the reduced electric field (E/P) has also been investigated. These relationships can be applied to AC-PDP manufacturing in order to enhance the luminous efficiency and to reduce the breakdown voltage of AC-PDPs.
引用
收藏
页码:809 / 812
页数:4
相关论文
共 12 条
[1]   INFLUENCE OF SECONDARY-ELECTRON EMISSION FROM MGO SURFACES ON VOLTAGE-BREAKDOWN CURVES IN PENNING MIXTURES FOR INSULATED-ELECTRODE DISCHARGES [J].
ABOELFOTOH, MO ;
LORENZEN, JA .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (11) :4754-4759
[2]   AGING CHARACTERISTICS OF AC PLASMA DISPLAY PANELS [J].
ABOELFOTOH, MO ;
SAHNI, O .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (06) :645-653
[3]   THEORY OF AUGER EJECTION OF ELECTRONS FROM METALS BY IONS [J].
HAGSTRUM, HD .
PHYSICAL REVIEW, 1954, 96 (02) :336-365
[4]   THEORY OF AUGER NEUTRALIZATION OF IONS AT SURFACE OF A DIAMOND-TYPE SEMICONDUCTOR [J].
HAGSTRUM, HD .
PHYSICAL REVIEW, 1961, 122 (01) :83-+
[5]  
LUTH H, 1995, SURFACE INTERFACES S, pCH3
[6]   ION NEUTRALIZATION PROCESSES AT INSULATOR SURFACES AND CONSEQUENT IMPURITY MIGRATION EFFECTS IN SIO2 FILMS [J].
MCCAUGHAN, DV ;
KUSHNER, RA ;
MURPHY, VT .
PHYSICAL REVIEW LETTERS, 1973, 30 (13) :614-617
[7]  
MOTOYAMA Y, 1999, 52 ANN GAS EL C
[8]   Two-dimensional simulation of an alternating current matrix plasma display cell: Cross-talk and other geometric effects [J].
Punset, C ;
Boeuf, JP ;
Pitchford, LC .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (04) :1884-1897
[9]   ION SECONDARY-ELECTRON EMISSION FROM AL2O3 AND MGO FILMS [J].
RAJOPADHYE, NR ;
JOGLEKAR, VA ;
BHORASKAR, VN ;
BHORASKAR, SV .
SOLID STATE COMMUNICATIONS, 1986, 60 (08) :675-679
[10]   INFLUENCE OF SECONDARY-ELECTRON EMISSION COEFFICIENT OF ARGON ON PASCHEN BREAKDOWN CURVES IN AC PLASMA PANELS FOR NEON + 0.1 PERCENT ARGON MIXTURE [J].
SAHNI, O ;
LANZA, C .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (11) :5107-5108