True atomic resolution in liquid by frequency-modulation atomic force microscopy

被引：276

作者：

Fukuma, T ^{[1
]}

Kobayashi, K

Matsushige, K

Yamada, H

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6158510, Japan

[2] Kyoto Univ, Int Innovat Ctr, Kyoto 6068501, Japan

来源：

APPLIED PHYSICS LETTERS | 2005年 / 87卷 / 03期

关键词：

D O I：

10.1063/1.1999856

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

True atomic resolution of frequency-modulation atomic force microscopy in liquid is demonstrated. Hexagonal lattice of a cleaved (001) surface of muscovite mica is resolved in water. Nonperiodic structures such as defects and adsorbates are simultaneously imaged with the atomic-scale features of mica surface. The use of small oscillation amplitude (0.16-0.33 nm) of a force sensing cantilever allows us to obtain vertical and lateral resolutions of 2-6 and 300 pm, respectively, even with a low Q factor in water (Q=20-30). (c) 2005 American Institute of Physics.

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页数：3

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