Binary-encounter electron emission after fast heavy-ion impact on complex rare- and molecular-gas targets

被引:12
作者
Bechthold, U
Ullrich, J
Ramm, U
Kraft, G
Hagmann, S
Schultz, DR
Reinhold, CO
Schmidt-Bocking, H
机构
[1] Gesell Schwerionenforsch mbH, D-64291 Darmstadt, Germany
[2] Kansas State Univ, JR Macdonald Lab, Manhattan, KS 66506 USA
[3] Oak Ridge Natl Lab, Div Phys, Oak Ridge, TN 37831 USA
[4] Inst Kernphys, D-60486 Frankfurt, Germany
来源
PHYSICAL REVIEW A | 1998年 / 58卷 / 03期
关键词
D O I
10.1103/PhysRevA.58.1971
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Doubly differential cross sections (DDCSs) for electron emission have been measured for collisions of 3.6 MeV/u Ne10+, Xe40+ and 5.9 MeV/u U29+ On neon, xenon, water, ethanol, methanol, propanol, C2F6, SF6, and C3F8. Electrons ejected with emission angles between 0 degrees and 180 degrees with respect to the ion beam axis have been recorded simultaneously using a toroidal electron spectrometer. We analyze the singly differential cross section (SDCS) for binary encounter electron (BEe) production as a function of target electron number and laboratory emission angle. We find that there exists a linear scaling of the BEe SDCS with the number of electrons bound in the target with an energy lower than the reduced projectile energy. The enhancement of BEe production in the forward direction in collisions with partially stripped ions is studied for the different projectiles and targets and compared to theoretical calculations.
引用
收藏
页码:1971 / 1979
页数:9
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