The MYTHEN detector for X-ray powder diffraction experiments at the Swiss Light Source

被引：225

作者：

Bergamaschi, Anna ^{[1
]}

Cervellino, Antonio ^{[1
]}

Dinapoli, Roberto ^{[1
]}

Gozzo, Fabia ^{[1
]}

Henrich, Beat ^{[1
]}

Johnson, Ian ^{[1
]}

Kraft, Philipp ^{[1
]}

Mozzanica, Aldo ^{[1
]}

Schmitt, Bernd ^{[1
]}

Shi, Xintian ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2010年 / 17卷

关键词：

detectors; powder diffraction; MATERIALS SCIENCE BEAMLINE; COUNTING MICROSTRIP DETECTOR; SYNCHROTRON-RADIATION; RIETVELD REFINEMENT; SINGLE-CRYSTAL; PIXEL; SYSTEM; DAMAGE; PERFORMANCE;

D O I：

10.1107/S0909049510026051

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The MYTFIEN single-photon-counting silicon microstrip detector has been developed at the Swiss Light Source for time-resolved powder diffraction experiments An upgraded version of the detector has been installed at the SLS powder diffraction station allowing the acquisition of diffraction patterns over 120 degrees in 20 in fractions of seconds. Thanks to the outstanding performance of the detector and to the calibration procedures developed, the quality of the data obtained IS now comparable with that of traditional high-resolution point detectors in terms of FWHM resolution and peak profile shape. with the additional advantage of fast and simultaneous acquisition of the full diffraction pattern MYTH EN is therefore optimal for time-resolved or dose-critical measurements The characteristics of the MYTH EN detector together with the calibration procedures Implemented for the optimization of the data are described in detail The refinements of two known standard powders are discussed together with a remarkable application of MYTHEN to organic compounds in relation to the problem of radiation damage.

引用

页码：653 / 668

页数：16

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