Normal modes of a Si(100) double-paddle oscillator

被引：57

作者：

Spiel, CL ^{[1
]}

Pohl, RO

Zehnder, AT

机构：

[1] Cornell Univ, Atom & Solid State Phys Lab, Ithaca, NY 14853 USA

[2] Cornell Univ, Dept Theoret & Appl Mech, Ithaca, NY 14853 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2001年 / 72卷 / 02期

关键词：

D O I：

10.1063/1.1340559

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Six low-frequency eigenmodes of a double-paddle oscillator have been measured and have been identified with a finite-element model. The internal friction Q(-1) of these modes has been measured in the range of 4-80 K. Only one of the oscillator's modes has a Q(-1)< 3x10(-8) below 40 K, which is furthermore very reproducible. All other modes have a higher internal friction which is not as reproducible and also sometimes changes after thermal cycling. It is shown that the internal friction of the different modes is related to the restoring force needed to hold the oscillator in place. The finite-element model is used to predict the damping of the different modes. (C) 2001 American Institute of Physics.

引用

页码：1482 / 1491

页数：10

共 27 条

[1] Anomalous frequency dependence of the internal friction of vitreous silica [J].

Classen, J ;

Burkert, T ;

Enss, C ;

Hunklinger, S .

PHYSICAL REVIEW LETTERS, 2000, 84 (10) :2176-2179

[2] Annealing of amorphous ice films [J].

Hessinger, J ;

Pohl, RO .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1996, 208 (1-2) :151-161

[3]

*HIBB KARLSS SOR, ABAQUS VERS 5 8 2

[4] SINGLE-CRYSTAL SILICON HIGH-Q TORSIONAL OSCILLATORS [J].

KLEIMAN, RN ;

KAMINSKY, GK ;

REPPY, JD ;

PINDAK, R ;

BISHOP, DJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (11) :2088-2091

[5] 2-LEVEL SYSTEMS OBSERVED IN THE MECHANICAL-PROPERTIES OF SINGLE-CRYSTAL SILICON AT LOW-TEMPERATURES [J].

KLEIMAN, RN ;

AGNOLET, G ;

BISHOP, DJ .

PHYSICAL REVIEW LETTERS, 1987, 59 (18) :2079-2082

[6]

Landau LD, 1976, COURSE THEORETICAL P, V1

[7] Low-temperature internal friction in metal films and in plastically deformed bulk aluminum [J].

Liu, X ;

Thompson, EJ ;

White, BE ;

Pohl, RO .

PHYSICAL REVIEW B, 1999, 59 (18) :11767-11776

[8] Low-energy excitations in amorphous films of silicon and germanium [J].

Liu, X ;

Pohl, RO .

PHYSICAL REVIEW B, 1998, 58 (14) :9067-9081

[9] Amorphous solid without low energy excitations [J].

Liu, X ;

White, BE ;

Pohl, RO ;

Iwanizcko, E ;

Jones, KM ;

Mahan, AH ;

Nelson, BN ;

Crandall, RS ;

Veprek, S .

PHYSICAL REVIEW LETTERS, 1997, 78 (23) :4418-4421

[10]

LIU X, IN PRESS APPL PHYS L

← 1 2 3 →