High temperature conductivity behavior of doped SrTiO3 thin films

被引:8
作者
Ohly, C
Hoffmann, S
Szot, K
Waser, R
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[2] Rhein Westfal TH Aachen Klinikum, Inst Werkstoff Elektrotech 2, D-52074 Aachen, Germany
关键词
SrTiO3; thin film; conductivity; oxygen partial pressure; morphology; defect chemistry; segregation phenomena;
D O I
10.1080/10584580108222318
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to investigate the dominant charge transport mechanisms of doped SrTiO3 thin films, high temperature measurements were performed under varying oxygen partial pressures. To meet specific demands of SrTiO3 thin films, a common 4-point measuring setup was improved profoundly by full triaxial shielding and the use of a solid state oxygen pump (made of YSZ). This allowed a precise analysis in the temperature range from 700 degreesC to 1000 degreesC and at oxygen partial pressures (pO(2)) between 10(-20) bar and 1 bar. The conduction behavior of (doped) SrTiO3 thin films. as a function of pO(2), revealed characteristics that substantially differ from those of bulk ceramics and cannot be explained by point defect chemistry. Additionally, segregation effects have been observed which lead to a restructuring of the film's morphology to a significant extent.
引用
收藏
页码:363 / 372
页数:10
相关论文
共 14 条
[1]   NON-STOICHIOMETRY IN SRTIO3 [J].
CHAN, NH ;
SHARMA, RK ;
SMYTH, DM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (08) :1762-1769
[2]   Accurate sensors offering unrestricted recalibration and long-term stability for determining high temperatures on the basis of gas-sensitive effects of different gases on metal oxides [J].
Gerblinger, J ;
Heppel, U ;
Meixner, H .
SENSORS AND ACTUATORS B-CHEMICAL, 1996, 34 (1-3) :224-228
[3]   Influence of precursor chemistry on the formation of MTiO3 (M = Ba, Sr) ceramic thin films [J].
Hasenkox, U ;
Hoffmann, S ;
Waser, R .
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 1998, 12 (02) :67-79
[4]   Control of the morphology of CSD-prepared (Ba,Sr)TiO3 thin films [J].
Hoffmann, S ;
Waser, R .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1999, 19 (6-7) :1339-1343
[5]   Chemical solution deposited BaTiO3 and SrTiO3 thin films with columnar microstructure [J].
Hoffmann, S ;
Hasenkox, U ;
Waser, R ;
Jia, CL ;
Urban, K .
EPITAXIAL OXIDE THIN FILMS III, 1997, 474 :9-14
[6]   Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films [J].
Hofman, W ;
Hoffmann, S ;
Waser, R .
THIN SOLID FILMS, 1997, 305 (1-2) :66-73
[7]  
KLEITZ M, 1983, ANAL CHEM S SERIES, V17, P262
[8]  
KRUGER G, COMMUNICATION
[9]  
Moos R, 1997, J AM CERAM SOC, V80, P2549, DOI 10.1111/j.1151-2916.1997.tb03157.x
[10]   Surfaces of reduced and oxidized SrTiO3 from atomic force microscopy [J].
Szot, K ;
Speier, W .
PHYSICAL REVIEW B, 1999, 60 (08) :5909-5926