Soft errors in advanced computer systems

被引：559

作者：

Baumann, R ^{[1
]}

机构：

[1] Texas Instruments Inc, Silicon Technol Dev Component Reliabil Grp, Dallas, TX 75243 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2005年 / 22卷 / 03期

关键词：

D O I：

10.1109/MDT.2005.69

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent. The discussion covers ground-level radiation mechanisms that have the most serious impact on circuit operation, along with the effect of technology scaling on soft-error rates in memory and logic. © 2005 IEEE.

引用

页码：258 / 266

页数：9

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