Cross-sectional TEM observation of multilayer structure of a galvannealed steel

被引：33

作者：

Kato, T ^{[1
]}

Hong, MH ^{[1
]}

Nunome, K ^{[1
]}

Sasaki, K ^{[1
]}

Kuroda, K ^{[1
]}

Saka, H ^{[1
]}

机构：

[1] Nagoya Univ, Dept Quantum Engn, Nagoya, Aichi 46401, Japan

来源：

THIN SOLID FILMS | 1998年 / 319卷 / 1-2期

关键词：

focused ion beam; transmission electron microscopy; steel;

D O I：

10.1016/S0040-6090(97)01108-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A focused ion beam (FIB) technique was applied to the preparation of a cross-sectional transmission electron microscopy (TEM) specimen of Zn-coated steels. Two types of steel were observed. One is an as-dipped steel (galvanized (GI) steel) and the other is a steel annealed for 20 s at 773 K after dipping in a molten zinc bath (gal vannealed (GA) steel). For both steels, the whole depth of the Zn coating from the outermost surface to the steel substrate was observed and the microstructures characterized. (C) 1998 Published by Elsevier Science S.A.

引用

页码：132 / 139

页数：8