Photon-stimulated ion desorption for PMMA thin film in the oxygen K-edge region studied by Auger electron-photoion coincidence spectroscopy

被引：27

作者：

Ikenaga, E

Kudara, K

Kusaba, K

Isari, K

Sardar, SA

Wada, S

Mase, K

Sekitani, T ^{[1
]}

Tanaka, K

机构：

[1] Hiroshima Univ, Dept Phys Sci, Higashihiroshima 7398526, Japan

[2] Hiroshima Univ, Ctr Synchrotron Radiat, Higashihiroshima 7398526, Japan

[3] Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2001年 / 114卷

基金：

日本学术振兴会;

关键词：

photon-stimulated desorption (PSD); poly-methylmethacrylate (PMMA); auger electron spectroscopy (AES); auger electron-photoion coincidence (AEPICO);

D O I：

10.1016/S0368-2048(00)00325-X

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Auger electron-photoion coincidence (AEPICO) measurements have been performed for poly-methylmethacrylate (PMMA) thin films induced by oxygen core excitation. The dominant productions of CHn+ (n=1-3) ions were observed at resonant excitation to o-CH3 anti-bonding state, and OCH+ ion was observed at resonant excitation to C-OCH3 anti-bonding state. Their AEPICO yields were strongly dependent on Anger electron kinetic energy and shows enhancement around 505 eV Anger electron energy for each ion. This seems to be related to the spectator resonant Anger-stimulated ion desorption. The correlation between ion desorption and Anger final state for PMMA. thin films in the oxygen K-edge region is discussed. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：585 / 590

页数：6

共 21 条

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