High-speed transmission electron microscope

被引:74
作者
Dömer, H [1 ]
Bostanjoglo, O [1 ]
机构
[1] Tech Univ Berlin, Inst Opt, D-10623 Berlin, Germany
关键词
D O I
10.1063/1.1611612
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A high-speed transmission electron microscope was developed for probing laser-induced fast nonperiodical processes on the nanosecond time scale. 7-11 ns illuminating electron pulses-up to three-are produced by a laser pulse-driven photocathode. The electron gun can be used both for nanosecond exposure and conventional stationary operation. The introduced microscope is operated in three different modes for investigations of laser treated thin films- (1) Bright-field imaging, tracking changes of the texture and transport of neutral material; (2) dark-field imaging, mapping transient plasmas; and (3) selected area diffraction to study fast phase transitions. Presently, the space resolution is approximate to200 nm. (C) 2003 American Institute of Physics.
引用
收藏
页码:4369 / 4372
页数:4
相关论文
共 16 条
[1]   A REFLECTION ELECTRON-MICROSCOPE FOR IMAGING OF FAST PHASE-TRANSITIONS ON SURFACES [J].
BOSTANJOGLO, O ;
HEINRICHT, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (04) :1223-1229
[2]  
Bostanjoglo O, 2002, ADV IMAG ELECT PHYS, V121, P1
[3]   Pulsed photoelectron microscope for imaging laser-induced nanosecond processes [J].
Bostanjoglo, O ;
Weingartner, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (06) :2456-2460
[4]  
BOSTANJOGLO O, 1986, MATER RES SOC S P, V71, P345
[5]   TIME-GATED IMAGING WITH AN ULTRASHORT-PULSE, LASER-PRODUCED-PLASMA X-RAY SOURCE [J].
GORDON, CL ;
YIN, GY ;
LEMOFF, BE ;
BELL, PM ;
BARTY, CPJ .
OPTICS LETTERS, 1995, 20 (09) :1056-1058
[6]  
HOBEL F, 2003, THESIS TU BERLIN
[7]   HIGH-INTENSITY ULTRAVIOLET-LASER INTERACTION WITH A METALLIC FILAMENT [J].
HOLTMEIER, GM ;
ALEXANDER, DR ;
BARTON, JP .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (02) :557-563
[8]  
Iida T., 1988, PHYSICAL PROPERTIES, P217
[9]  
KHAJEHNOURI H, 2003, VERH DTSCH PHYS GES, V384, P20
[10]   Pulsed mirror electron microscope: A fast near-surface imaging probe [J].
Kleinschmidt, H ;
Bostanjoglo, O .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (10) :3898-3901