Evidence for two-phase regions in Ba0.5Sr0.5TiO3 thin films from capacitance-voltage data

被引：3

作者：

Jiang, AQ

Scott, JF

Sinnamon, LJ

Gregg, JM

机构：

[1] Univ Cambridge, Dept Earth Sci, Ctr Ferro, Cambridge CB2 3EQ, England

[2] Queens Univ Belfast, Sch Math & Phys, Condensed Matter Phys & Mat Sci Res Div, Belfast BT7 1NN, Antrim, North Ireland

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 16期

关键词：

D O I：

10.1063/1.1621735

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The Curie-Weiss plots of reciprocal dielectric constant versus temperature, in Ba0.5Sr0.5TiO3 films grown onto SrRuO3 lower electrodes by pulsed-laser deposition, show two minima below film thicknesses of 280 nm. This double minima implies possible mixed phases in the thin films. A graphical plot of capacitance for decreasing dc voltage versus that of increasing dc voltage shows a well-defined triangular shape for both Pb(Zr0.4Ti0.6)O-3 and SrBi2Ta2O9 thin films. However, for a 175-nm-thick Ba0.5Sr0.5TiO3 thin film, the plot shows an overlapping of two triangles, suggesting mixed phases. This graphical method appears to be effective in detecting structural subtleties in ferroelectric capacitors. (C) 2003 American Institute of Physics.

引用

页码：3359 / 3361

页数：3