Kinetic-Energy Discrimination for Atom Probe Tomography

被引:38
作者
Kelly, Thomas F. [1 ]
机构
[1] Cameca Instruments Inc, Madison, WI 53726 USA
关键词
atom probe tomography; kinetic-energy discrimination; mass spectroscopy; mass-energy spectrum; time-of-flight mass spectroscopy; peak interference; peak discrimination; mass resolving power; kinetic-energy resolving power; Kinetic-Energy Atom Probe (KEAP); DETECTORS; TIME;
D O I
10.1017/S1431927610094468
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The benefits of using kinetic-energy information to aid ion discrimination in atom probe tomography (APT) are explored. Ion peak interferences in time-of-flight (TOF) mass spectra are categorized by difficulty of discrimination using TOF and kinetic-energy information. Several of these categories, which are intractable interferences when only TOF information is available, may be discriminated when kinetic-energy information also is available. Furthermore, many opportunities for removing noise from composition determinations and three-dimensional images are enabled. Modest kinetic-energy resolving powers (KRPs) of 10 or so should be sufficient to have a major impact on APT. With KRP of about 100, the energy deficits in voltage pulsing may be resolved to enable peak discrimination in straight-flight-path instruments. Real examples and simulated mass spectra are used to illustrate the benefits of kinetic-energy discrimination. Many of the conclusions are applicable generally in TOF spectroscopy. Current detectors do not provide the kinetic energy of incoming ions, but there are realistic prospects for building such detectors and these are discussed. A program to develop these detectors should be pursued.
引用
收藏
页码:1 / 14
页数:14
相关论文
共 29 条
[1]   The AME2003 atomic mass evaluation (II). Tables, graphs and references [J].
Audi, G ;
Wapstra, AH ;
Thibault, C .
NUCLEAR PHYSICS A, 2003, 729 (01) :337-676
[2]   Advances in pulsed-laser atom probe: Instrument and specimen design for optimum performance [J].
Bunton, Joseph H. ;
Olson, Jesse D. ;
Lenz, Daniel R. ;
Kelly, Thomas F. .
MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) :418-427
[3]  
DRESCHLER M, 1960, P 4 INT C EL MICR BE, V1, P835
[4]   Time-of-Flight Mass Spectrometry With Latching Nb Meander Detectors [J].
Estey, Brian V. ;
Beall, James A. ;
Hilton, Gene C. ;
Irwin, Kent D. ;
Schmidt, Dan R. ;
Ullom, Joel N. ;
Schwall, Robert E. .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2009, 19 (03) :382-385
[5]   Superconducting tunnel junction photon detectors: Theory and applications [J].
Friedrich, S. .
JOURNAL OF LOW TEMPERATURE PHYSICS, 2008, 151 (1-2) :277-286
[6]  
FRISCH HJ, 2009, DEV LARGE AREA FAST, P14
[7]   Design of a femtosecond laser assisted tomographic atom probe [J].
Gault, B ;
Vurpillot, F ;
Vella, A ;
Gilbert, M ;
Menand, A ;
Blavette, D ;
Deconihout, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (04)
[8]   Estimation of the tip field enhancement on a field emitter under laser illumination [J].
Gault, B ;
Vurpillot, F ;
Bostel, A ;
Menand, A ;
Deconihout, B .
APPLIED PHYSICS LETTERS, 2005, 86 (09) :1-3
[9]   Impact energy measurement in time-of-flight mass spectrometry with cryogenic microcalorimeters [J].
Hilton, GC ;
Martinis, JM ;
Wollman, DA ;
Irwin, KD ;
Dulcie, LL ;
Gerber, D ;
Gillevet, PM ;
Twerenbold, D .
NATURE, 1998, 391 (6668) :672-675
[10]  
Irwin KD, 2005, TOP APPL PHYS, V99, P63