Simulating dynamic force microscopy imaging of a NaCl island using non-ideal tips

被引:9
作者
Oja, R [1 ]
Foster, AS [1 ]
机构
[1] Helsinki Univ Technol, Phys Lab, Espoo 02015, Finland
关键词
D O I
10.1088/0957-4484/16/3/002
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We use atomistic simulation to study how the contrast pattern in dynamic force microscopy depends on the structure of the tip. Using a NaCl island on the NaCl(001) surface as a template, we consider several different NaCl tip configurations, with and without OH contamination. We find that the most significant changes in images are produced by very soft tips, which demonstrate large relaxations due to tip-surface interaction. Harder tips produce qualitatively similar images regardless of the atomic configuration presented to the surface. Contamination of the tip by hydroxyl groups reduces the strength of the interaction, and, in certain configurations, can produce asymmetries in the image even on the flat terrace of the island.
引用
收藏
页码:S7 / S12
页数:6
相关论文
共 15 条
[1]   Dynamic SFM with true atomic resolution on alkali halide surfaces [J].
Bammerlin, M ;
Luthi, R ;
Meyer, E ;
Baratoff, A ;
Lu, J ;
Guggisberg, M ;
Loppacher, C ;
Gerber, C ;
Guntherodt, HJ .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S293-S294
[2]  
BAMMERLIN M, 1997, PROBE MICROSCOPY, V1, P3
[3]   Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy [J].
Barth, C ;
Henry, CR .
PHYSICAL REVIEW LETTERS, 2003, 91 (19) :196102/1-196102/4
[4]   Atomically resolved edges and kinks of NaCl islands on Cu(111):: Experiment and theory [J].
Bennewitz, R ;
Foster, AS ;
Kantorovich, LN ;
Bammerlin, M ;
Loppacher, C ;
Schär, S ;
Guggisberg, M ;
Meyer, E ;
Shluger, AL .
PHYSICAL REVIEW B, 2000, 62 (03) :2074-2084
[5]   Hamaker constants of inorganic materials [J].
Bergstrom, L .
ADVANCES IN COLLOID AND INTERFACE SCIENCE, 1997, 70 :125-169
[6]   Theoretical simulation of non-contact atomic force microscopy imaging of the α-alumina(0001) surface [J].
Gal, AY ;
Shluger, AL .
NANOTECHNOLOGY, 2004, 15 (02) :S108-S114
[7]   MARVIN - A NEW COMPUTER CODE FOR STUDYING SURFACES AND INTERFACES AND ITS APPLICATION TO CALCULATING THE CRYSTAL MORPHOLOGIES OF CORUNDUM AND ZIRCON [J].
GAY, DH ;
ROHL, AL .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS, 1995, 91 (05) :925-936
[8]   Advances in atomic force microscopy [J].
Giessibl, FJ .
REVIEWS OF MODERN PHYSICS, 2003, 75 (03) :949-983
[9]   Theories of scanning probe microscopes at the atomic scale [J].
Hofer, WA ;
Foster, AS ;
Shluger, AL .
REVIEWS OF MODERN PHYSICS, 2003, 75 (04) :1287-1331
[10]  
HOFFMANN R, PHYS REV LETT, V92, DOI UNSP 146103