Direct measure of the phase shift of an x-ray beam

被引:14
作者
Davis, TJ [1 ]
Stevenson, AW [1 ]
机构
[1] CSIRO,DIV MAT SCI & TECHNOL,CLAYTON,VIC 3169,AUSTRALIA
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1996年 / 13卷 / 06期
关键词
D O I
10.1364/JOSAA.13.001193
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Although it is widely known that an x-ray beam suffers from absorption on passing through matter, little attention has been given to the change in the phase of the transmitted x-ray beam. Using a recently developed method for differential phase-contrast imaging with hard x rays, we investigate the phase shift induced in an x-ray beam when it passes through a nonabsorbing plastic film, a pure-phase object. The film is bent into a hemicylinder so that it presents a thickness to the x rays that changes with position. This leads to phase changes that vary up to several multiples of 2 pi, which are observed in the x-ray images as changes in the contrast. We discuss the method of hard x-ray phase-contrast imaging and describe the experiments that enable us to measure the phase change induced in a beam of x rays of wavelength 0.154 nm. (C) 1996 Optical Society of America
引用
收藏
页码:1193 / 1198
页数:6
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