Polycycloalkanes as potential third-generation immersion fluids for photolithography at 193 nm

被引:25
作者
Lopez-Gejo, Juan
Kunjappu, Joy T.
Zhou, J.
Smith, B. W.
Zimmerman, Paul
Conley, Will
Turro, Nicholas J.
机构
[1] Columbia Univ, Dept Chem, New York, NY 10027 USA
[2] CUNY Brooklyn Coll, Dept Chem, Brooklyn, NY 11210 USA
[3] Rochester Inst Technol, Ctr Nanolithog Res, Rochester, NY 14623 USA
[4] SEMATECH, Austin, TX 78741 USA
[5] Freescale Semicond, Ctr Rech, Crolles, France
关键词
D O I
10.1021/cm0701660
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 [物理化学]; 081704 [应用化学];
摘要
In a search for alkane candidates for 193 nm immersion fluids, several alkanes and cycloalkanes were synthesized, purified, and screened to ascertain their absorption at 193 nm, refractive index, and temperature dispersion coefficient in the context of the actual application. In general, cycloalkanes, and more specifically polycycloalkanes, possess a higher refractive index than do linear alkanes. Decalin, cyclodecane, perhydrophenanthrene (PHP), perhydrofluorene (PHF), and perhydropyrene (PHPY) are examined as potential second- and third-generation immersion fluids. The use of perhydropyrene, which possesses a high refractive index of 1.7014 at 193 nm, may be limited as an immersion fluid because of high absorption at 193 nm. Mixtures of cycloalkanes can lead to a higher enhancement of the refractive index together with a decrease of the viscosity. Exhaustive purification of the fluids is a critical step in determining the real absorption of the different fluids at 193 nm. Even very small traces of impurities possessing a high absorption coefficient at 193 nm can lead to an unacceptably high level absorption at 193 nm, previously incorrectly attributed to the alkane instead of the absorbing impurities.
引用
收藏
页码:3641 / 3647
页数:7
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