High refractive index immersion fluids for 193nm immersion lithography

被引:14
作者
Budhlall, B [1 ]
Parris, G [1 ]
Zhang, P [1 ]
Gao, XP [1 ]
Zarkov, Z [1 ]
Ross, B [1 ]
Kaplan, S [1 ]
Burnett, J [1 ]
机构
[1] Air Prod & Chem Inc, Allentown, PA 18195 USA
来源
Optical Microlithography XVIII, Pts 1-3 | 2005年 / 5754卷
关键词
immersion fluid; high refractive index; immersion lithography; absorbance; 193nm; Hilger-Chance;
D O I
10.1117/12.600025
中图分类号
O43 [光学];
学科分类号
070207 [光学]; 0803 [光学工程];
摘要
For the next-generation immersion lithography technology, there is a growing interest in the immersion fluids having a refractive index larger than 1.5 and low absorbance at 193 nm wavelength. In this paper, we report our effort in identifying new immersion fluid candidates. The absolute refractive index values and thermo-optic coefficients, dn/dT, were measured with 1 x 10(-4) and 1 x 10(-5) accuracy respectively at 193 nm wavelength. The results showed promising candidates having refractive index ranging from 1.5 to 1.65 with low absorbance at 193 nm wavelength. Preliminary imaging results with a new immersion fluid gave good 65 nm Line/Space patterns. However, the minimum exposure time of 20sec is about ten times as needed for water, indicating the need to further reduce the absorbance of the immersion fluid.
引用
收藏
页码:622 / 629
页数:8
相关论文
共 10 条
[1]
Born M., 1999, PRINCIPLES OPTICS, P97
[2]
BUDHLALL B, 2004, ISTM S 157NM IMM LIT
[3]
Measurement of the refractive index and thermo-optic coefficient of water near 193 nm [J].
Burnett, JH ;
Kaplan, S .
OPTICAL MICROLITHOGRAPHY XVI, PTS 1-3, 2003, 5040 :1742-1749
[4]
DAMMEL R, 2004, ISTM S 157NM IMM LIT
[5]
Nomenclature, symbols, units, and their usage in spectrochemical analysis - XVII. Laser-based molecular spectrometry of chemical analysis: Absorption (IUPAC Recommendations 1999) [J].
Gauglitz, G ;
Moore, DS .
PURE AND APPLIED CHEMISTRY, 1999, 71 (11) :2189-2204
[6]
GIL D, 2004, ISTM S 157NM IMM LIT
[7]
SEWELL H, 2004, COMMUNICATION NOV
[8]
SMITH BW, 2000, SRC PROGRAM REV 2000
[9]
Immersion liquids for lithography in the deep ultraviolet [J].
Switkes, M ;
Kunz, RR ;
Sinta, RF ;
Rothschild, M ;
Gallagher-Wetmore, PM ;
Krukonis, VJ ;
Williams, K .
OPTICAL MICROLITHOGRAPHY XVI, PTS 1-3, 2003, 5040 :690-699
[10]
SWITKES M, 2002, J MICROLITH MICROFAB, V1, P225