Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source

被引：21

作者：

Engelhardt, Martin ^{[1
]}

Baumann, Joachim

Schuster, Manfred

Kottler, Christian

Pfeiffer, Franz

Bunk, Oliver

David, Christian

机构：

[1] Siemens AG, Corp Technol, D-81739 Munich, Germany

[2] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany

[3] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 09期

关键词：

D O I：

10.1063/1.2786273

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A refractive x-ray lens was characterized using a magnifying cone beam setup for differential phase contrast imaging in combination with a microfocus x-ray tube. Thereby, the differential and the total phase shift of x rays transmitted through the lens were determined. Lens aberrations have been characterized based on these refractive properties. (c) 2007 American Institute of Physics.

引用

页数：5

共 17 条

[1]

ANKERHOLD U, 2000, PTBDOS34

[2]

COWLEY JM, 1995, DIFFRACTION PHYS, P21

[3] Differential x-ray phase contrast imaging using a shearing interferometer [J].

David, C ;

Nöhammer, B ;

Solak, HH ;

Ziegler, E .

APPLIED PHYSICS LETTERS, 2002, 81 (17) :3287-3289

[4]

ENGELHARDT M, UNPUB J MICROSC

[5] High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source [J].

Engelhardt, Martin ;

Baumann, Joachim ;

Schuster, Manfred ;

Kottler, Christian ;

Pfeiffer, Franz ;

Bunk, Oliver ;

David, Christian .

APPLIED PHYSICS LETTERS, 2007, 90 (22)

[6] The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays [J].

Guigay, JP ;

Zabler, S ;

Cloetens, P ;

David, C ;

Mokso, R ;

Schlenker, M .

JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 :476-482

[7]

Hubbell J. H., TABLES XRAY MASS ATT

[8] Imaging by parabolic refractive lenses in the hard X-ray range [J].

Lengeler, B ;

Schroer, C ;

Tümmler, J ;

Benner, B ;

Richwin, M ;

Snigirev, A ;

Snigireva, I ;

Drakopoulos, M .

JOURNAL OF SYNCHROTRON RADIATION, 1999, 6 :1153-1167

[9] A microscope for hard x rays based on parabolic compound refractive lenses [J].

Lengeler, B ;

Schroer, CG ;

Richwin, M ;

Tümmler, J ;

Drakopoulos, M ;

Snigirev, A ;

Snigireva, I .

APPLIED PHYSICS LETTERS, 1999, 74 (26) :3924-3926

[10] Refractive x-ray lenses [J].

Lengeler, B ;

Schroer, CG ;

Kuhlmann, M ;

Benner, B ;

Guenzler, TF ;

Kurapova, O ;

Zontone, F ;

Snigirev, A ;

Snigireva, I .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (10A) :A218-A222

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