Performance evaluation of ballistic silicon nanowire transistors with atomic-basis dispersion relations

被引:47
作者
Wang, J [1 ]
Rahman, A [1 ]
Ghosh, A [1 ]
Klimeck, G [1 ]
Lundstrom, M [1 ]
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1873055
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, we explore the band structure effects on the performance of ballistic silicon nanowire transistors (SNWTs). The energy dispersion relations for silicon nanowires are evaluated with an sp(3)d(5)s* tight binding model. Based on the calculated dispersion relations, the ballistic currents for both n-type and p-type SNWTs are evaluated by using a seminumerical ballistic model. For large diameter nanowires, we find that the ballistic p-SNWT delivers half the ON-current of a ballistic n-SNWT. For small diameters, however, the ON-current of the p-type SNWT approaches that of its n-type counterpart. Finally, the carrier injection velocity for SNWTs is compared with those for planar metal-oxide-semiconductor field-effect transistors, clearly demonstrating the impact of quantum confinement on the performance limits of SNWTs. (C) 2005 American Institute of Physics.
引用
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页码:1 / 3
页数:3
相关论文
共 19 条
[1]   Valence band effective-mass expressions in the sp3d5s* empirical tight-binding model applied to a Si and Ge parametrization -: art. no. 115201 [J].
Boykin, TB ;
Klimeck, G ;
Oyafuso, F .
PHYSICAL REVIEW B, 2004, 69 (11)
[2]   Valley splitting in strained silicon quantum wells [J].
Boykin, TB ;
Klimeck, G ;
Eriksson, MA ;
Friesen, M ;
Coppersmith, SN ;
von Allmen, P ;
Oyafuso, F ;
Lee, S .
APPLIED PHYSICS LETTERS, 2004, 84 (01) :115-117
[3]   High performance silicon nanowire field effect transistors [J].
Cui, Y ;
Zhong, ZH ;
Wang, DL ;
Wang, WU ;
Lieber, CM .
NANO LETTERS, 2003, 3 (02) :149-152
[4]   Effects of atomistic defects on coherent electron transmission in Si nanowires: Full band calculations [J].
Ko, YJ ;
Shin, M ;
Lee, S ;
Park, KW .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (01) :374-379
[5]   Boundary conditions for the electronic structure of finite-extent embedded semiconductor nanostructures [J].
Lee, S ;
Oyafuso, F ;
von Allmen, P ;
Klimeck, G .
PHYSICAL REVIEW B, 2004, 69 (04)
[6]   QUANTUM CAPACITANCE DEVICES [J].
LURYI, S .
APPLIED PHYSICS LETTERS, 1988, 52 (06) :501-503
[7]   Small-diameter silicon nanowire surfaces [J].
Ma, DDD ;
Lee, CS ;
Au, FCK ;
Tong, SY ;
Lee, ST .
SCIENCE, 2003, 299 (5614) :1874-1877
[8]  
MAJIMA H, 2001, IEDM, P733
[9]   Bandstructure effects in ballistic nanoscale MOSFETs [J].
Rahman, A ;
Klimeck, G ;
Boykin, TB ;
Lundstrom, M .
IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2004, TECHNICAL DIGEST, 2004, :139-142
[10]   Theory of ballistic nanotransistors [J].
Rahman, A ;
Guo, J ;
Datta, S ;
Lundstrom, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (09) :1853-1864