Surface roughness, strain, and alloy segregation in lattice-matched heteroepitaxy

被引:14
作者
Priester, C [1 ]
Grenet, G
机构
[1] CNRS, UMR 9929, Dept ISEN, IEMN, F-59652 Villeneuve Dascq, France
[2] Ecole Cent Lyon, LEAME, CNRS, UMR 5512, F-69131 Ecully, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 04期
关键词
D O I
10.1116/1.590185
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spinodal decomposition of ternary semiconductor alloys during lattice-matched heteroepitaxy is considered here. It has been previously demonstrated that a perfectly flat surface (with no step) would forbid alloy demixing. The case of a rough surface is the purpose of this article. How the possibility of a better strain relaxation introduced by the surface roughness can favor alloy demixing is analyzed first. The present results are exemplified by the AlInAs lattice matched to the InP case. Second, a step-by-step model is proposed to simulate the growth process on a rough surface. This model leads to a description of the strain and alloy demixing during this growth. This study clearly shows how and why the atoms corresponding to binary materials with lower surface tension naturally tend to segregate towards bumped areas. (C) 1998 American Vacuum Society.
引用
收藏
页码:2421 / 2425
页数:5
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