A continuum model for size-dependent deformation of elastic films of nano-scale thickness

被引:172
作者
He, LH
Lim, CW [1 ]
Wu, BS
机构
[1] City Univ Hong Kong, Dept Bldg & Construct, Kowloon 0000, Hong Kong, Peoples R China
[2] Univ Sci & Technol China, CAS, Key Lab Mech Behav & Design Mat, Hefei 230026, Anhui, Peoples R China
[3] Jilin Univ, Dept Math, Changchun 130023, Jilin, Peoples R China
关键词
thin film; surface elasticity; size effect;
D O I
10.1016/j.ijsolstr.2003.10.001
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
Ultra-thin elastic films of nano-scale thickness with an arbitrary geometry and edge boundary conditions are analyzed. An analytical model is proposed to study the size-dependent mechanical response of the film based on continuum surface elasticity. By using the transfer-matrix method along with an asymptotic expansion technique of small parameter, closed-form solutions for the mechanical field in the film is presented in terms of the displacements on the mid-plane. The asymptotic expansion terminates after a few terms and exact solutions are obtained. The mid-plane displacements are governed by three two-dimensional equations, and the associated edge boundary conditions can be prescribed on average. Solving the two-dimensional boundary value problem yields the three-dimensional response of the film. The solution is exact throughout the interior of the film with the exception of a thin boundary layer having an order of thickness as the film in accordance with the Saint-Venant's principle. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:847 / 857
页数:11
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