Wall thickness and core radius determination in surfactant templated silica thin films using GISAXS and X-ray reflectivity

被引：34

作者：

Gibaud, A ^{[1
]}

Baptiste, A

Doshi, DA

Brinker, CJ

Yang, L

Ocko, B

机构：

[1] Univ Maine, Fac Sci, F-72085 Le Mans 09, France

[2] Univ New Mexico, Albuquerque, NM 87106 USA

[3] Sandia Natl Labs, Albuquerque, NM 87185 USA

[4] Brookhaven Natl Lab, Upton Long Isl, NY 11987 USA

来源：

EUROPHYSICS LETTERS | 2003年 / 63卷 / 06期

关键词：

D O I：

10.1209/epl/i2003-00596-9

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray reflectometry and GISAXS (grazing angle small angle scattering) are combined to investigate the morphology and structural parameters of a surfactant templated 2D hexagonal thin-film silica mesophase. It is shown that X-ray reflectivity measurements contain invaluable information about the radius of the cylindrical rods and the distance between their cores. The reflectivity data are analyzed using a model of the electron density and combined with GISAXS measurements to derive the silica wall thickness.

引用

页码：833 / 839

页数：7

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