Determination of the conversion gain and the accuracy of its measurement for detector elements and arrays

被引:32
作者
Beecken, BP [1 ]
Fossum, ER [1 ]
机构
[1] CALTECH,JET PROP LAB,PASADENA,CA 91109
来源
APPLIED OPTICS | 1996年 / 35卷 / 19期
关键词
conversion gain; photon noise limit; detector-array uniformity; charge coupled device; active pixel sensor;
D O I
10.1364/AO.35.003471
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Standard statistical theory is used to calculate how the accuracy of a conversion-gain measurement depends on the number of samples. During the development of a theoretical basis for this calculation, a model is developed that predicts how the noise levels from different elements of an ideal detector array are distributed. The model can also be used to determine what dependence the accuracy of measured noise has on the size of the sample. These features have been confirmed by experiment, thus enhancing the credibility of the method for calculating the uncertainty of a measured conversion gain. (C) 1996 Optical Society of America
引用
收藏
页码:3471 / 3477
页数:7
相关论文
共 8 条
[1]  
BEVINGTON PR, 1992, DATA REDUCTION ERROR, P63
[2]  
DICKINSON A, 1995, P IEEE INT SOLID STA, V38, P226
[3]   RESPONSE OF A CORRELATED DOUBLE SAMPLING CIRCUIT TO 1-F NOISE [J].
KANSY, RJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (03) :373-375
[4]   CMOS ACTIVE PIXEL IMAGE SENSOR [J].
MENDIS, S ;
KEMENY, SE ;
FOSSUM, ER .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (03) :452-453
[5]  
MEYER SL, 1975, DATA ANAL SCI ENG, P261
[6]  
MILTON JS, 1986, PROBABILITY STAT ENG, P219
[7]  
MILTON JS, 1986, PROBABILITY STATISTI, P220
[8]  
NIXON RH, 1995, P SOC PHOTO-OPT INS, V2415, P117, DOI 10.1117/12.206529