Interfacial structure in (111) Au:Ni multilayers investigated by anomalous x-ray diffraction -: art. no. 125414

被引:27
作者
Bigault, T [1 ]
Bocquet, F
Labat, S
Thomas, O
Renevier, H
机构
[1] Fac Sci & Tech St Jerome, CNRS, TECSEN, F-13397 Marseille 20, France
[2] CNRS, Cristallog Lab, F-38042 Grenoble, France
关键词
D O I
10.1103/PhysRevB.64.125414
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the structure of buried interfaces in (111) Au:Ni multilayers. Conventional x-ray diffraction at constant energy as well as anomalous x-ray scattering across the Ni absorption K edge have been used. Whereas the fitting of the spectra at a single energy leads to two different possible interfacial structures, the anomalous diffracted intensity variation unambiguously favors a model with an interfacial concentration gradient at one interface. The multilayer presents an intermixed region extending on six atomic planes around the Ni/Au interface, whereas the Au/Ni interface is chemically abrupt. This structure can explain the unusual stress-strain relation previously reported on this system.
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页数:11
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