Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering

被引：19

作者：

Chow, GM

Goh, WC

Hwu, YK

Cho, TS

Je, JH

Lee, HH

Kang, HC

Noh, DY

Lin, CK

Chang, WD

机构：

[1] Natl Univ Singapore, Dept Mat Sci, Singapore 117543, Singapore

[2] Acad Sinica, Inst Phys, Taipei 11529, Taiwan

[3] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea

[4] Feng Chia Univ, Dept Mat Sci, Taichung 40724, Taiwan

[5] Synchrotron Radiat Res Ctr, Hsinchu 300, Taiwan

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 16期

关键词：

D O I：

10.1063/1.125062

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Conventional x-ray diffraction failed to provide correct information on alloying of materials made of elements with close lattice parameters, even for elements commonly accepted to have miscibility. Using anomalous x-ray scattering, we showed that nanostructured NiCo films did not necessarily form solid solution as expected from their phase diagram or suggested by the results of conventional x-ray diffraction. (C) 1999 American Institute of Physics. [S0003-6951(99)02542-5].

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收藏

页码：2503 / 2505

页数：3

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