Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L1(2)-type Ni-3(Al,Ta)

被引：7

作者：

Horita, Z ^{[1
]}

McCartney, MR ^{[1
]}

Kuninaka, H ^{[1
]}

机构：

[1] ARIZONA STATE UNIV, CTR SOLID STATE SCI, TEMPE, AZ 85287 USA

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1997年 / 75卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1080/01418619708210288

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni-3(Al,Ta) intermetallic compound with the Ll(2)-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the Al and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the Al and Ni columns.

引用

页码：153 / 167

页数：15

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