DELOCALIZATION CORRECTIONS USING A DISORDERED STRUCTURE FOR ATOM LOCATION BY CHANNELING-ENHANCED MICROANALYSIS IN THE NI-AL SYSTEM

被引：11

作者：

HORITA, Z ^{[1
]}

KUNINAKA, H ^{[1
]}

SANO, T ^{[1
]}

NEMOTO, M ^{[1
]}

SPENCE, JCH ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1993年 / 67卷 / 02期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1080/01418619308207168

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A correction procedure for the delocalization effect when determining the site occupancy of an impurity element by atom location by channelling-enhanced microanalysis is proposed. The procedure utilizes a disordered structure with a composition similar to the ordered structure. Correction factors are derived by illuminating a sample with a disordered structure in the same orientation as for the ordered structure. The correction procedure is applied to a determination of the Ti occupancy in a Ni3Al intermetallic compound.

引用

页码：425 / 432

页数：8

共 18 条

[1]

BENTLEY J, 1986, 11TH P INT C EL MICR, V1, P551

[2] CRYSTALLOGRAPHIC ORIENTATION EFFECTS IN ENERGY DISPERSIVE-X-RAY ANALYSIS [J].