Electrical impedance tomography

被引：108

作者：

Saulnier, GJ ^{[1
]}

Blue, RS

Newell, JC

Isaacson, D

Edic, PM

机构：

[1] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12181 USA

[2] Gen Elect, Corp Res & Dev Ctr, CT Program, Niskayuna, NY USA

[3] Albany Med Coll, Albany, NY 12208 USA

来源：

IEEE SIGNAL PROCESSING MAGAZINE | 2001年 / 18卷 / 06期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/79.962276

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：31 / 43

页数：13

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