Aggregation quenching in thin films of MEH-PPV studied by near-field scanning optical microscopy and spectroscopy

被引:29
作者
Huser, T [1 ]
Yan, M [1 ]
机构
[1] Univ Calif Lawrence Livermore Natl Lab, Dept Chem & Mat Sci, Livermore, CA 94551 USA
关键词
NSOM; photoluminescence; MEH-PPV; conjugated polymers; aggregates;
D O I
10.1016/S0379-6779(00)00432-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Aggregates in thin films of conjugated polymers form excimer states and significantly reduce the photo- and electroluminescence efficiency in devices produced from these materials. We have studied the aggregate formation in thin films of poly(2-methoxy,5-(2'-ethylhexyloxy)-p-phenylene-vinylene) (MEH-PPV) by near-field scanning optical microscopy and spectroscopy. Local photoluminescence spectroscopy and photo-bleaching experiments have been used to show that thin films of MEH-PPV are homogeneously aggregated and do not form aggregated domains. Published by Elsevier Science B.V.
引用
收藏
页码:333 / 337
页数:5
相关论文
共 16 条
  • [11] Photophysics of phenylenevinylene polymers
    Rothberg, LJ
    Yan, M
    Papadimitrakopoulos, F
    Galvin, ME
    Kwock, EW
    Miller, TM
    [J]. SYNTHETIC METALS, 1996, 80 (01) : 41 - 58
  • [12] Fluorescence scanning near-field optical microscopy of conjugated polymer blends
    Stevenson, R
    Granström, M
    Richards, D
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (11) : 1574 - 1576
  • [13] Application of fluorescence scanning near-field optical microscopy to the study of phase-separated conjugated polymers
    Webster, S
    Smith, DA
    Batchelder, DN
    Lidzey, DG
    Bradley, DDC
    [J]. ULTRAMICROSCOPY, 1998, 71 (1-4) : 275 - 279
  • [14] Study of conjugated polymer blend films by a near field scanning optical microscopy
    Wei, PK
    Hsu, JH
    Fann, WS
    [J]. SYNTHETIC METALS, 1999, 102 (1-3) : 1209 - 1210
  • [15] WEI PK, UNPUB PHYS REV B
  • [16] DEFECT QUENCHING OF CONJUGATED POLYMER LUMINESCENCE
    YAN, M
    ROTHBERG, LJ
    PAPADIMITRAKOPOULOS, F
    GALVIN, ME
    MILLER, TM
    [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (05) : 744 - 747