Magnetic Force Microscopy;
soft magnetic thin films;
D O I:
10.1016/0304-8853(95)01237-0
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
This work considers the interactions between scanning probe microscope tips with thin magnetic coatings and soft thin films of permalloy. It is shown that the stray field from the tip can be large enough to cause perturbations of the magnetic structures in the sample being imaged. Results for various tip geometries are discussed.