Magnetic force microscopy of soft magnetic materials

被引：12

作者：

Valera, MS

Tomlinson, SL

Heydon, GP

Farley, AN

Hoon, SR

Zhou, L

McVitie, S

Chapman, JN

机构：

[1] MANCHESTER METROPOLITAN UNIV, SCH PHYS, MANCHESTER M1 5GD, LANCS, ENGLAND

[2] UNIV GLASGOW, DEPT PHYS & ASTRON, GLASGOW G12 8QQ, LANARK, SCOTLAND

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1996年 / 157卷

基金：

英国工程与自然科学研究理事会;

关键词：

magnetic force microscopy; permalloy; soft magnetic materials;

D O I：

10.1016/0304-8853(95)01064-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The magnetic force microscopy of soft magnetic materials is a challenge due to the perturbing effect of the tip stray field on the sample magnetisation. Ferromagnetic thin film tips have been characterised by Lorentz electron microscopy and the tips employed in the study of a permalloy magneto-resistive sensor. Residual domains in the permalloy were detected and the location of domain walls related to the presence of imperfections in the edge of the sensor.

引用

页码：555 / 556

页数：2

共 6 条

[1]

GRUTTER P, 1990, APPL PHYS LETT, V57, P1820, DOI 10.1063/1.104030

[2] MAGNETIZATION DISTRIBUTIONS IN THIN-FILM PERMALLOY STRIPS [J].