Ultrahigh vacuum scanning probe microscopy studies of carbon onions

被引：11

作者：

Hou, SM ^{[1
]}

Tao, CG

Zhang, GM

Zhao, XY

Xue, ZQ

Shi, ZJ

Gu, ZN

机构：

[1] Peking Univ, Dept Elect, Beijing 100871, Peoples R China

[2] Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China

来源：

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 2001年 / 9卷 / 02期

基金：

中国国家自然科学基金;

关键词：

carbon onions; scanning probe microscopy; scanning tunneling spectroscopy;

D O I：

10.1016/S1386-9477(00)00273-3

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Carbon onions were prepared by DC are charge method. The behavior and electronic propel ties of carbon onions on highly oriented pyrolytic graphite (HOPG) substrate were studied by ultrahigh vacuum atomic force microscopy and scanning tunneling microscopy (UHV AFM/STM). UHV AFM/STM images showed that these ellipsoidal carbon onions tended to aggregate into clusters on the surface of HOPG. The scanning tunneling spectroscopy indicated that the electrical properties of carbon onions were between graphite and single-shell fullerenes. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：300 / 304

页数：5

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