Magnetization reversal in nanostructured Co/Pt multilayer dots and films

被引:42
作者
Thielen, M [1 ]
Kirsch, S [1 ]
Weinforth, H [1 ]
Carl, A [1 ]
Wassermann, EF [1 ]
机构
[1] Univ Duisburg Gesamthsch, D-47048 Duisburg, Germany
关键词
magnetic nanostructures; optical interference lithography; magnetization reversal; magnetic force microscopy;
D O I
10.1109/20.706340
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the magnetic properties of large scale periodic magnetic nanostructures designed as dot-arrays with periodicity ranging between 300nm and 1100nm, consisting of Co/Pt multilayer dots with respective diameters ranging between 230nm and 740nm. The nanostructures are fabricated by using optical interference lithography allowing for large area (cm(2)) fabrication. The Co/Pt multilayer dots show a pronounced out-of-plane magnetic anisotropy. The magnetic properties are determined from magnets-optical Kerr effect measurements in polar geometry and results are compared to respective continuous Co/Pt multilayer thin films. The micromagnetic properties of both, films and nanostructures are investigated with magnetic force microscopy allowing for the application of an external perpendicular magnetic field of up to B = 0.15T.
引用
收藏
页码:1009 / 1011
页数:3
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