Scanning probe microscopy of high-temperature superconductors

被引：32

作者：

de Lozanne, A ^{[1
]}

机构：

[1] Univ Texas, Dept Phys, Austin, TX 78712 USA

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1999年 / 12卷 / 04期

关键词：

D O I：

10.1088/0953-2048/12/4/001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High-temperature superconductors (HTS) and scanning probe microscopes have been developed at a rapid rate over the last decade and a half. The cross-linking between these two exciting fields has produced many beautiful-results and new possibilities that are still being explored. The highlights of these results are reviewed here, with emphasis on scanning microscopes based on tunnelling (STM), atomic force (AFM), magnetic force (MFM), the Hall effect (SHPM), a SQUID sensor, microwaves, near-field optics, or magneto-optic techniques. These tools are used in the characterization of HTS from the routine evaluation of surface topography to the sophisticated elucidation of the symmetry of the order parameter. Some more recent techniques and possible new directions are also discussed.

引用

页码：R43 / R56

页数：14

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