共 49 条
[4]
Evolution of line-edge roughness during fabrication of high-index-contrast microphotonic devices
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2003, 21 (06)
:2892-2896
[5]
Direct UV patterning of waveguide devices in AS2Se3 thin films
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
2004, 22 (03)
:1044-1047