Small signal and power measurements of AlGaN/GaN HEMT with SiN passivation

被引:42
作者
Lee, JS
Vescan, A
Wieszt, A
Dietrich, R
Leier, H
Kwon, YS
机构
[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Yusong Gu, Taejon 305701, South Korea
[2] DaimlerChrysler AG, Res & Technol, D-89013 Ulm, Germany
关键词
D O I
10.1049/el:20010100
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Small signal S-parameters and loadpull measurements are reported for AlGaN/GaN HEMT devices with 200nm SiN passivation. The maximum output power increases from 0.59W/ mm to 1.45W/mm and the efficiency is also enhanced from 16 to 27% for 2x50 mum HEMT devices after SiN passivation. Small signal equivalent circuit parameters including parasitic and intrinsic ones have been extracted from the measured S-parameters and are used to explain the effect of SSI on the power characteristics.
引用
收藏
页码:130 / 132
页数:3
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