共 4 条
Small signal and power measurements of AlGaN/GaN HEMT with SiN passivation
被引:42
作者:
Lee, JS
Vescan, A
Wieszt, A
Dietrich, R
Leier, H
Kwon, YS
机构:
[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Yusong Gu, Taejon 305701, South Korea
[2] DaimlerChrysler AG, Res & Technol, D-89013 Ulm, Germany
关键词:
D O I:
10.1049/el:20010100
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Small signal S-parameters and loadpull measurements are reported for AlGaN/GaN HEMT devices with 200nm SiN passivation. The maximum output power increases from 0.59W/ mm to 1.45W/mm and the efficiency is also enhanced from 16 to 27% for 2x50 mum HEMT devices after SiN passivation. Small signal equivalent circuit parameters including parasitic and intrinsic ones have been extracted from the measured S-parameters and are used to explain the effect of SSI on the power characteristics.
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页码:130 / 132
页数:3
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