Study of positronium in low-k dielectric films by means of 2D-angular correlation experiments at a high-intensity slow-positron beam

被引:11
作者
Gessmann, T [1 ]
Petkov, MP
Weber, MH
Lynn, KG
Rodbell, KP
Asoka-Kumar, P
Stoeffl, W
Howell, RH
机构
[1] Washington State Univ, Dept Phys, Pullman, WA 99163 USA
[2] IBM Corp, Div Res, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
[3] Lawrence Livermore Natl Lab, Dept Phys, Livermore, CA 94551 USA
来源
POSITRON ANNIHILATION - ICPA-12 | 2001年 / 363-3卷
关键词
angular correlation; para-positronium; slow position beam; thermalisation;
D O I
10.4028/www.scientific.net/MSF.363-365.585
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Depth-resolved measurements of two-dimensional angular correlation of annihilation radiation (2D-ACAR) were performed at the intense slow-positron beam at Lawrence Livermore National Laboratory. The formation of positronium was studied in thin films of methyl-silsesquioxane (MSSQ) spin-on glass containing large open-volume defects (voids). Two samples with different average void sizes were investigated and positronium formation could be found in both cases. The width of the angular correlation related to annihilation of para-positronium (p-Ps) increased with the void size consistent with the annihilation of nonthermalized p-Ps.
引用
收藏
页码:585 / 587
页数:3
相关论文
共 9 条
  • [1] Asoka-Kumar P, 1999, AIP CONF PROC, V475, P361
  • [2] Study of the structure of porous silicon via positron annihilation experiments
    Biasini, M
    Ferro, G
    Monge, MA
    Di Francia, G
    La Ferrara, V
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 2000, 12 (27) : 5961 - 5970
  • [3] Determination of pore-size distribution in low-dielectric thin films
    Gidley, DW
    Frieze, WE
    Dull, TL
    Sun, J
    Yee, AF
    Nguyen, CV
    Yoon, DY
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (10) : 1282 - 1284
  • [4] Positronium annihilation in mesoporous thin films
    Gidley, DW
    Frieze, WE
    Dull, TL
    Yee, AF
    Ryan, ET
    Ho, HM
    [J]. PHYSICAL REVIEW B, 1999, 60 (08): : R5157 - R5160
  • [5] Study of the SiO2-Si interface using variable energy positron two-dimensional angular correlation of annihilation radiation
    Peng, JP
    Lynn, KG
    AsokaKumar, P
    Becker, DP
    Harshman, DR
    [J]. PHYSICAL REVIEW LETTERS, 1996, 76 (12) : 2157 - 2160
  • [6] Doppler broadening positron annihilation spectroscopy: A technique for measuring open-volume defects in silsesquioxane spin-on glass films
    Petkov, MP
    Weer, MH
    Lynn, KG
    Rodbell, KP
    Cohen, SA
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (15) : 2146 - 2148
  • [7] Open volume defects (measured by positron annihilation spectroscopy) in thin film hydrogen-silsesquioxane spin-on-glass; correlation with dielectric constant
    Petkov, MP
    Weber, MH
    Lynn, KG
    Rodbell, KP
    Cohen, SA
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 86 (06) : 3104 - 3109
  • [8] PETKOV MP, UNPUB APPL PHYS LETT
  • [9] INTERACTION OF POSITRON BEAMS WITH SURFACES, THIN-FILMS, AND INTERFACES
    SCHULTZ, PJ
    LYNN, KG
    [J]. REVIEWS OF MODERN PHYSICS, 1988, 60 (03) : 701 - 779