Laser-ablation deposition of CeO2 thin films on biaxially textured nickel substrates

被引:20
作者
Boffa, V
Petrisor, T
Ceresara, S
Ciontea, L
Fabbri, F
Scardi, P
机构
[1] ENEA, Ctr Ric Frascati, I-00044 Frascati, Italy
[2] Ctr Innovaz Lecco, I-22053 Lecco, Italy
[3] Univ Trent, Dipartimento Ingn Mat, I-38050 Trent, Italy
[4] Tech Univ Cluj, Cluj Napoca 3400, Romania
来源
PHYSICA C | 1999年 / 312卷 / 3-4期
关键词
ceria; Ni substrates; laser ablation;
D O I
10.1016/S0921-4534(98)00711-4
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ceria buffer layers were deposited by pulsed laser ablation on (100)[001] cube-textured Ni substrate for the fabrication of high-current Y-Ba-Cu-O tapes for power applications. The films were grown both on Pd-buffered Ni and on pure Ni substrates. The CeO2 film deposited directly on Ni was not fully epitaxially grown as it had a polycrystalline component. On the contrary, the theta-2 theta X-ray diffraction pattern of Ni-Pd-CeO2 architecture contained only the (h00) peaks of Pd, Ni and CeO2, indicating good epitaxy of Pd and CeO2 on Ni, and the pole figure showed (100)[001] texture for Pd film and Ni substrate, and (100)[011] for CeO2 film. The surface of the as-obtained CeO2 films was smooth and continuous, hence appropriate for further YBCO film deposition. (C) 1999 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:202 / 212
页数:11
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