Sensitivity and S/N-ratio of superconducting high-resolution X-ray spectrometers

被引：16

作者：

Drury, OB

Friedrich, S

机构：

[1] Lawrence Livermore Natl Lab, Adv Detector Grp, Livermore, CA 94550 USA

[2] Lawrence Berkeley Natl Lab, Adv Biol & Environm Xray Facil, Berkeley, CA USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2005年 / 15卷 / 02期

关键词：

sensitivity; superconducting devices; superconducting tunnel junctions; X-ray spectroscopy detectors;

D O I：

10.1109/TASC.2005.849959

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Superconducting tunnel junction (STJ) X-ray spectrometers have been developed for synchrotron-based high-resolution soft X-ray spectroscopy. We are quantifying the improvements in sensitivity and signal-to-noise ratio that STJ spectrometers can offer for the analysis of dilute specimens over conventional semiconductor and grating spectrometers. We present analytical equations to quantify the improvements in terms of spectrometer resolution, detection efficiency and count rate capabilities as a function of line separation and spectral background. We discuss the implications of this analysis for L-edge spectroscopy of first-row transition metals.

引用

收藏

页码：613 / 617

页数：5

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