Metal-oxide bilayer Raman scattering in SrTiO3 thin films

被引：39

作者：

Merkulov, VI

Fox, JR

Li, HC

Si, WD

Sirenko, AA

Xi, XX

机构：

[1] Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China

[2] Penn State Univ, Dept Phys, University Pk, PA 16802 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 25期

关键词：

D O I：

10.1063/1.121627

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used a metal-oxide bilayer Raman scattering technique to study lattice dynamics in SrTiO3 thin films. The SrTiO3 thin films were epitaxially grown on a conducting metal-oxide layer which reflects the exciting laser beam so that it does not enter the LaAlO3 substrate. Raman scattering from the SrTiO3 thin films was clearly observed, including the first-order Raman peaks forbidden by the cubic symmetry in single crystals. We suggest that strain exists in the films, which changes the crystal symmetry and will affect the dielectric properties of the SrTiO3 thin films. (C) 1998 American Institute of Physics. [S0003-6951(98)02725-9].

引用

页码：3291 / 3293

页数：3

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