Electron-hole pair contributions to scattering, sticking, and surface diffusion: CO on Cu(100)

被引:77
作者
Kindt, JT
Tully, JC
Head-Gordon, M
Gomez, MA
机构
[1] Yale Univ, Dept Chem, New Haven, CT 06511 USA
[2] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA
[3] Univ Calif Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
关键词
D O I
10.1063/1.476960
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
To assess the importance of coupling to electron-hole pair (ehp) excitations for molecular sticking, scattering, and diffusion dynamics at metal surfaces, simulations of the CO/Cu(100) system were performed using the "molecular dynamics with electronic frictions" method. Over a range of incident translational energies, energy losses to ehp excitations produce a moderate increase in sticking probability and account for 5%-10% of initial translational energy in scattered molecules, significantly less than phonon losses. Vibrational excitation and deexcitation of scattered molecules, while remaining a minor pathway for energy flow, is strongly affected by the inclusion of ehp excitations. Finally, although equilibrium diffusion constants are unaffected by the inclusion of coupling to ehp, it causes a significant quenching of transient mobility following adsorption of translationally hot molecules. (C) 1998 American Institute of Physics.
引用
收藏
页码:3629 / 3636
页数:8
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