Three-dimensional vector electrochemical strain microscopy

被引：27

作者：

Balke, N. ^{[1
]}

Eliseev, E. A. ^{[2
]}

Jesse, S. ^{[1
]}

Kalnaus, S. ^{[3
]}

Daniel, C. ^{[3
]}

Dudney, N. J. ^{[3
]}

Morozovska, A. N. ^{[4
]}

Kalinin, S. V. ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

[2] Natl Acad Sci Ukraine, Inst Problems Mat Sci, UA-03142 Kiev, Ukraine

[3] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA

[4] Natl Acad Sci Ukraine, Inst Semicond Phys, UA-03028 Kiev, Ukraine

来源：

JOURNAL OF APPLIED PHYSICS | 2012年 / 112卷 / 05期

关键词：

RECHARGEABLE LITHIUM BATTERIES; PIEZORESPONSE FORCE MICROSCOPY; NANOMETER RESOLUTION; ION DIFFUSION; LI; CHALLENGES; PROBE;

D O I：

10.1063/1.4746085

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Three-dimensional vector imaging of bias-induced displacements of surfaces of ionically conductive materials using electrochemical strain microscopy (ESM) is demonstrated for model polycrystalline LiCoO2 surface. We demonstrate that resonance enhanced imaging using band excitation detection can be performed both for out-of-plane and in-plane response components at flexural and torsional resonances of the cantilever, respectively. The image formation mechanism in vector ESM is analyzed and relationship between measured signal and grain orientation is discussed. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4746085]

引用

页数：7

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