An asymmetric memory cell using a C-TFT for single-bit-line SRAM's

被引:6
作者
Kuriyama, H [1 ]
Ashida, M [1 ]
Tsutsumi, K [1 ]
Maegawa, S [1 ]
Maeda, S [1 ]
Anami, K [1 ]
Nishimura, T [1 ]
Kohno, Y [1 ]
Miyoshi, H [1 ]
机构
[1] Mitsubishi Elect Co, ULSI Lab, Itami, Hyogo 664, Japan
关键词
asymmetric memory cell (AMC); cell ratio; complementary TFT (C-TFT); low-power; low-voltage; n-channel TFT; p-channel TFT; single-bit-line; SRAM; static noise margin (SNM);
D O I
10.1109/16.760399
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a compact single-bit-line SRAM memory cell which we call an asymmetric memory cell (AMC) using a complementary thin-film transistor (C-TFT). A C-TFT is composed of a top-gate n-channel TFT and a bottom-gate p-channel TFT. The proposed cell size can be reduced to 88% as compared with the conventional one using 0.4-μm design rules. Stable read and write operations under low-voltage can be realized by using a C-TFT. © 1999 IEEE.
引用
收藏
页码:927 / 932
页数:6
相关论文
共 13 条
[1]   DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS [J].
DENNARD, RH ;
GAENSSLEN, FH ;
YU, HN ;
RIDEOUT, VL ;
BASSOUS, E ;
LEBLANC, AR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) :256-268
[2]  
HAYASHI F, 1992, S VLSI, P36
[3]  
Ikeda S., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P809, DOI 10.1109/IEDM.1993.347276
[4]  
Itabashi K., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P477, DOI 10.1109/IEDM.1991.235352
[5]  
ITOH K, 1991, 1991 INT C SOL STAT, P468
[6]  
KURIYAMA H, 1992, S VLSI TECHN DIG TEC, P38
[7]   A 0.4 MU-M GATE-ALL-AROUND TFT (GAT) USING A DUMMY NITRIDE PATTERN FOR HIGH-DENSITY MEMORIES [J].
MAEGAWA, S ;
IPPOSHI, T ;
MAEDA, S ;
NISHIMURA, H ;
TANINA, O ;
KURIYAMA, H ;
INOUE, Y ;
NISHIMURA, T ;
TSUBOUCHI, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1995, 34 (2B) :895-899
[8]  
Ohkubo H., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P481, DOI 10.1109/IEDM.1991.235351
[9]   A 16-MB CMOS SRAM WITH A 2.3-MU-M(2) SINGLE-BIT-LINE MEMORY CELL [J].
SASAKI, K ;
UEDA, K ;
TAKASUGI, K ;
TOYOSHIMA, H ;
ISHIBASHI, K ;
YAMANAKA, T ;
HASHIMOTO, N ;
OHKI, N .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1993, 28 (11) :1125-1130
[10]   STATIC-NOISE MARGIN ANALYSIS OF MOS SRAM CELLS [J].
SEEVINCK, E ;
LIST, FJ ;
LOHSTROH, J .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (05) :748-754