DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS

被引:2074
作者
DENNARD, RH [1 ]
GAENSSLEN, FH [1 ]
YU, HN [1 ]
RIDEOUT, VL [1 ]
BASSOUS, E [1 ]
LEBLANC, AR [1 ]
机构
[1] IBM CORP, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
关键词
D O I
10.1109/JSSC.1974.1050511
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:256 / 268
页数:13
相关论文
共 18 条
[1]  
BROERS AN, 1973, SEMICONDUCTOR SILICO, P830
[2]  
CHANG W, PRIVATE COMMUNICATIO
[3]   DESIGN AND CHARACTERISTICS OF N-CHANNEL INSULATED-GATE FIELD-EFFECT TRANSISTORS [J].
CRITCHLOW, DL ;
DENNARD, RH ;
SCHUSTER, SE .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (05) :430-442
[4]  
DENNARD RH, 1972, IEEE INT ELECTRON DE
[5]   ELECTRON-BEAM FABRICATION OF ION-IMPLANTED HIGH-PERFORMANCE FET CIRCUITS [J].
FANG, F ;
HATZAKIS, M ;
TING, CH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (06) :1082-1085
[6]   TRANSPORT PROPERTIES OF ELECTRONS IN INVERTED SILICON SURFACES [J].
FANG, FF ;
FOWLER, AB .
PHYSICAL REVIEW, 1968, 169 (03) :619-+
[7]  
HENDERSON RC, 1973, TECH DIG INT ELECTRO, P138
[8]  
JOHNSON W, PRIVATE COMMUNICATIO
[9]   STEADY-STATE MATHEMATICAL THEORY FOR INSULATED GATE FIELD-EFFECT TRANSISTOR [J].
KENNEDY, DP ;
MURLEY, PC .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (01) :1-12
[10]   ANALYSIS OF THRESHOLD VOLTAGE FOR SHORT-CHANNEL IGFETS [J].
LEE, HS .
SOLID-STATE ELECTRONICS, 1973, 16 (12) :1407-1417